Fabrication and electrical properties of laser-shaped thick-film and LTCC microresistors
نویسندگان
چکیده
The dimensions of discrete passives, passive integrated components (arrays, networks) and embedded integral ones should be reduced significantly in the nearest future. Therefore the relations between technological accuracy and limitations, minimal geometrical dimensions and electrical as well as stability properties becomemore andmore important. This paper presents systematic studies of thick-film or LTCC microresistors made with the aid of laser shaping. The investigations are concerned with miniaturization of two resistor dimensions, namely length (down to 30 lm) and width (also down to 30 lm). The sheet resistance, hot temperature coefficient of resistance (HTCR) as well as long-term stability and durability of test structures to various short electrical pulses were related to geometrical properties of microresistors. Such investigations proved that combining of current materials and fabrication methods used in modern thick-film and LTCC technologies with laser shaping made possible fabrication of 30 30 lm microresistors with satisfactory electrical properties and can serve as interesting alternative for thick-film and LTCC resistors miniaturization. 2009 Elsevier Ltd. All rights reserved.
منابع مشابه
Thick-Film and LTCC Passive Components for High-Temperature Electronics
At this very moment an increasing interest in the field of high-temperature electronics is observed. This is a result of development in the area of wide-band semiconductors’ engineering but this also generates needs for passives with appropriate characteristics. This paper presents fabrication as well as electrical and stability properties of passive components (resistors, capacitors, inductors...
متن کاملAdvanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors
As-fired thick-film resistors have the resistance tolerance within ±20% and this tolerance is increased for smaller components. Therefore the novel trimming methods are necessary for microresistors, especially when they are embedded in LTCC substrate. This paper compares electrical (normalized temperature dependence of resistance, low frequency noise) and stability properties (relative resistan...
متن کاملFabrication of LTCC Micro-fluidic Devices Using Sacrificial Carbon Layers
Ease of fabrication and design flexibility are two attractive features of low temperature co-fired ceramics (LTCC) technology for fabrication of complex micro-fluidic devices. Such structures are designed and processed using different shaping methods, the extent and complexity of which depends on the final device specifications (dimensions, mechanical and functional properties). In this work, w...
متن کاملLow Temperature Co-fired Ceramic (LTCC) Technology: General Processing Aspects and Fabrication of 3-D Structures for Micro-fluidic Devices
LTCC technology is based on sintering of multi-layered thick-film sheets (50-250μm) or so-called green tapes, which are screen-printed with thick-film pastes such as conductors, resistors, etc. The terms low temperature and co-fired originate from the relatively low sintering temperatures (<900°C) compared to conventional ceramics and simultaneous firing of tapes together with screen-printed th...
متن کاملEvaluation of compatibility of thick-film PTC thermistors and LTCC structures
The electrical and microstructural characteristics of 1 kX/sq. thick-film thermistors with high positive temperature coefficients of resistivity, i.e. PTC 5093 (Du Pont) fired either on ‘‘green’’ LTCC (low temperature cofired ceramics) substrates or buried within LTCC structures, were evaluated. The active phase (ruthenium oxide) in the PTC thermistors is not present in the dried films but is f...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 49 شماره
صفحات -
تاریخ انتشار 2009